Scanning systems - the next generation

Next generation of scanning systems: single gantry linear drives, dual gantry linear drives, new intelligent linear motion z axis system


  • New high performance digitizers up to 7 GSPS for high performance SAM analysis and imaging
  • New thin film transducers with customized design 85 MHz-2000 MHz
  • Next generation of failure analysis SAMs with puls echo and tone burst excitation modes
  • WINSAM 8 graphical user interface W10/ 64 bit
  • New GHz scanning systems combined with optical top table microscopes and inverted microscopes 

 


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PVA TePla Analytical Systems GmbH
Deutschordenstrasse 38
73463 Westhausen, Germany

Phone: +49 7363 9544 0
Fax: +49 7363 9544 113

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