Metro4-3D

We are privileged to be part of the European joint project, Metro4-3D (Metrology for future 3D-technologies) which aims to maintain a strong position in the metrology area for semiconductor industry.


PVA TePla Analytical Systems GmbH’s main objective on this joint project is to detect internal defects in the BEOL layers, Through-Si Vias (TSV’s) and micro-bumps as well as voids or cracks in stacked dies and wafers using a GHz Scanning Acoustic Microscope.

To learn more about Metro4-3D, go to http://metro4-3d.eu/index.php


Sofort-Kontakt

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PVA TePla Analytical Systems GmbH
Deutschordenstrasse 38
73463 Westhausen

Telefon: +49 (0) 7363 9544 0
Fax: +49 (0) 7363 9544 113