• 1. SAM Line - SAM 300  
  SAM 300  
• 2. SAM Line  
  SAM 304 Low-maintenance, high-speed linear motor scanner Analysis of samples in the ultrasound frequency range up to 400 MHz Equipped with a graphical user interface for ease of…  
• 3. 3D Puck metrology - Product data  
  Product data Puck dimensions: The standard system comes with holders for 6 and 8 inches, allowing thicknesses from 5 to 45 mm. Puck geometry: Cylindrical with one, two, or…  
• 4. 3D Puck metrology  
  3D puck metrologySiC Defect Mapping Process The SiC puck scanning applies advanced 3D metrology to map internal defects in SiC before  wafering. 3D Scanning: The SiC puck is scanned to…  
• 5. 3D Puck metrology  
  SAM 301 SiC In traditional SiC substrate production, the first comprehensive control of internal defects takes place at wafer level, when substantial resources have already been spent for…  
• 6. SAM Premium Line  
  SAM 301 SiC To product pageSAM 1000/2000These two systems were developed for high-end research and industry applications. A combined scanning acoustic microscope and an inverted light…  
• 7. 3D Puck metrology  
  The SAM 301 SiC, developed by Scientific Visual and PVA TePla, enables advanced 3D mapping of internal defects in silicon carbide (SiC) pucks. The concept is straightforward: it becomes possible to…  
• 8. SAM Premium Line  
   
• 9. 3D Puck metrology  
  Yes, there is no difference in scanning quality.  
• 10. 3D Puck metrology  
  The scanner visualizes most lattice defects, including micropipes, polytypes, dislocation bundles, and inclusions. Individual dislocations are not visible.